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DATE
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VENUE
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FEES
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REGISTRATION
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27 Jul - 28 Jul, 2017 |
Johor Bahru |
SGD 2644 |
Closed |
|
03 Apr - 04 Apr, 2017 |
Penang, Malaysia |
SGD 2644 |
Closed |
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30 Mar - 31 Mar, 2017 |
Taipei, Taiwan |
SGD 2899 |
Closed |
|
04 Aug - 05 Aug, 2016 |
Bangkok, Thailand |
SGD 2495 |
Closed |
Following information: Venue at
Bangkok, Thailand
| Training Date from
04 Aug 2016 till
05 Aug 2016
|
COURSE LEVEL
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DURATIONS
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Early Bird Discount
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Standard Price
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MASTER
|
2
day/s
|
SGD 2295 Purchase it before
05 Jul 2016
|
SGD 2495
|
WORKSHOP OVERVIEW
Set up and manage World Class Electronic Reliability Improvement Programmes to drive Failure Rate Reduction
WHAT WILL YOU LEARN?
- Understand how to develop Unique and Effective Low Cost Accelerated Stress Test programmes.
- Predict Reliability from Accelerated Testing.
- Understand how to focus on Early Life Reliability Testing and Improvement to drive Customer Satisfaction improvement.
- Realizing the need to develop unique Reliability Test programmes as opposed to following old ineffective Military Standards for Reliability Testing.
- How to set up a World Class Reliability Test approach to suit all product types.
- Changing company culture from Retrospective to Predictive.
- Giving engineers and management the ability to control and predict Process Reliability.
- Learn how to improve and manage Design Quality.
CASE STUDIES & PAST PARTICIPANTS ACHIEVEMENT: - Realize how world class companies manage Reliability and make major cost savings in Field Failure costs.
- Understand how to make your Accelerated Testing most efficient and low cost.
- Making Reliability Testing much more effective and NOT generic according to Military Std specs which many companies follow due to lack of knowledge.
- Realizing the need for making Accelerated Testing unique to the product type to maximise effectiveness.
- Ability to drive 50% REDUCTION in Field Failures within 12-18 months once a new and effective low cost programme set up.
PROGRAMME
- Understanding Basic Reliability
- Understanding MTTF and effect on Product Level Fail Rates
- Accelerated Stress Testing and effect of Activation Energy
- Understand Accelerated Testing to set up Predictive Testing Models for all products at RD stage
- Semiconductor Defect Types Review
- Brainstorming session to define most effective Sequential Stress Test programme for packaged device reliability evaluation
- Statistics involved in Reliability Estimation and Decision Making
- Evaluating the effectiveness of different stress test types with the Hughes Test Strength Equation
- Relationship of Manufacturing Yield with Early Life Failure Rate
- Life Test Planning
- Sub-Assy Reliability Stress Testing
- Weibull Analysis of Failure data and how to apply to any product failure data
- Applying DOE using Fractional Factorial techniques to maximise effect of Stress Test with reduced samples
- Setting up strong Design Quality Test Programme and using Design Maturity Measurement to measure Design Capability
- Predicting Field fail Rates using development test Information from a Design Quality Engineering Test programme
- Setting up New Product Introduction scoring model to deliver strongest Design Quality into Mass Production to maximise Reliability
AUDIENCE
- R&D engineers.
- Research Team.
- Quality Lab/Departments.
- Design Team.
- Manufacturing
- Design reliability section.
- Electronic Team.
- Anyone who is doing reliability testing at design stage.
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